ELECTRON MICROSCOPY: THEORY AND APPLICATIONS
Academic year and teacher
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- Versione italiana
- Academic year
- 2022/2023
- Teacher
- MATTEO FERRONI
- Credits
- 6
- Didactic period
- Primo Semestre
- SSD
- FIS/01
Training objectives
- The course addresses the following main topics: Introducing the fundamentals of electron microscopy and the basic design of the scanning and the transmission electron microscopes.
The theory of image formation, the definition of resolution, and the description of a system of lenses are extended and revised to describe the operating principles of the electron microscope, which works with a beam of accelerated electrons.
The different imaging methods available for the electron microscopes are described, with emphasis on the utility of electron microscopy to characterise functional materials down to the atomic level. Prerequisites
- Knowledge of Mathematical Analysis I and II, Physics I and II, as well as Chemistry and Solid State Physics.
Course programme
- Optical and electron microscopy: theoretical basis and applications, working principles of scanning and transmission electron microscopy (SEM and TEM).
Fourier Optics, definition of resolution. Electron-sample interaction and generation of signals useful for conventional SEM microscopy ( Secondary Electrons and Backscattered Electrons) as well as for TEM microscopy (Diffraction of electrons and Transmitted Electrons).
Introduction to image processing manipulation.
Case studies and practical examples. Didactic methods
- Frontal lessons. Visit and practical demonstrations at the IMM-CNR laboratories of microscopy.
Learning assessment procedures
- Final examination - Oral
Reference texts
- Transmission Electron Microscopy - A Textbook for Materials Science
Authors: Williams, David B., Carter, C. Barry ISBN 978-0-387-76501-3
Lecture notes
